Egorov V.N., Tokareva E.Yu. INCREASING THE PRECISION OF MEASUREMENTS OF RESONANCE CHARACTERISTICS/ Measurement Techniques. 2017. v. 60. no 7. p. 676.
Egorov V.N., Kashchenko M.V., Masalov V.L., Tokareva E.Yu., Quang N.Q.
NATIONAL PRIMARY STANDARD FOR THE UNITS OF COMPLEX DIELECTRIC PERMITTIVITY IN THE FREQUENCY RANGE FROM 1 TO 178.4 GHz./ Measurement Techniques. 2014. v. 57. no 1. p. 1.
Egorov V.N. CHARACTERISTICS OF MICROWAVE RESONATORS WITH NONRESONANT POWER LEAKAGE. /Radiophysics and Quantum Electronics. 2011. v. 53. no  8. p. 443.
Egorov V.N., Masalov V.L., Ozhogov I.B. ANISOTROPY OF DIELECTRIC LOSSES IN AL2O3 AND SIO2 SINGLE CRYSTALS. /Technical Physics Letters. 2009. v. 35. no 12. p. 1081.
Egorov V.N. RESONANCE METHODS FOR MICROWAVE STUDIES OF DIELECTRICS (REVIEW). /Instruments and Experimental Techniques. 2007. v. 50. no 2. p. 143.
Egorov V.N., Masalov V.L., Nefyodov Y.A., Shevchun A.F., Trunin M.R., Zhitomirsky V.E., McLean M. DIELECTRIC CONSTANT, LOSS TANGENT, AND SURFACE RESISTANCE OF PCB MATERIALS AT K BAND FREQUENCIES./ IEEE Transactions on Microwave Theory and Techniques. 2005. v. 53. no 2. p. 627.
Egorov V.N., Masalov V.L., Nefyodov Yu.A., Shevchun A.F., Trunin M.R. MEASURING MICROWAVE PROPERTIES OF LAMINATED DIELECTRIC SUBSTRATES./ Review of Scientific Instruments. 2004. v. 75. no 11. p. 4423.
Egorov V.N., Kashchenko M.V. THE MEASUREMENT OF SMALL DIELECTRIC LOSSES IN A CAVITY RESONATOR./ Measurement Techniques. 2002. v. 45. no 1. p. 93.
Egorov V.N., Volovikov A.S. MEASURING THE DIELECTRIC PERMITTIVITY OF SAPPHIRE AT TEMPERATURES 93...343K. /Radiophysics and Quantum Electronics. 2001. v. 44. no 11. p. 885.